NewView 6000 is an optical profiler for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features. It delivers 0.1 nm height resolution, independent of surface texture, magnification, or feature height (up to 15000 microns) at high speeds. All measurements are nondestructive, fast, and require no sample preparation.

Additional Resources

Zygo NuView 6000
Training Contact: Sivasubramanian Somu
Service Contact: Scott McNamara