Park XE7 provides accurate measurement at highest nanoscale resolution due its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. The XY scanner consists of symmetrical 2-dimensional flexure and high-force piezoelectric stacks provides high orthogonal movement with minimal out-of-plane motion as well as high responsiveness essential for precise sample scanning in the nanometer scale. The travel range of the XY sample stage is 13 mm x 13 mm. The focus mechanism for the on-axis optics is adjusted manually. Metrology can be done employing true non-contact, basic contact, lateral force and phase imaging modes.
Warning: require_once(/home/kostas/public_html/test2.php): failed to open stream: No such file or directory in /home/kostas/public_html/wp-content/themes/Northeastern/ToolDetail.php on line 112
Fatal error: require_once(): Failed opening required '/home/kostas/public_html/test2.php' (include_path='.:/usr/lib/php:/usr/local/lib/php') in /home/kostas/public_html/wp-content/themes/Northeastern/ToolDetail.php on line 112